Beijing Institute of Automatic Test Technology was established in 1984, and it’s the only specialized institute in China to carry out integrated circuit (IC) testing technology research, development and sale of testing system, and IC testing service. 

    Since its founding, the Institute has undertaken lots of national programs in tackling key problems in science and technology and important research and development projects of Beijing municipality. It has achieved a series of scientific results that takes the lead in China and reaches international standards; it has also built the national IC testing program library. These achievements have won lots of rewards from Ministry of Electronics Industry and Ministry of Mechanical and Electronic Industry, as well as Scientific and Technological Progress Awards of Beijing Municipality. The two research programs, “development and industrialization of BC3196 large-scale mixed-signal IC testing system” and “development and industrialization of VXI large-scale mixed-signal IC testing system” won second-rate Scientific and Technological Progress Awards of Beijing Municipality in 2004 and 2005 respectively. The “IC testing equipment with high performance micro processor as graphic generator” technique was awarded a patent right, and three programs were entitled as among the top ten scientific and technological achievements of BJAST, namely “testing system of discrete semiconductor production line”, “BC3192VXI large-scale mixed-signal IC testing system” and “BC3196 large-scale mixed-signal IC testing system”.

     During the process of industrialization, the Institute has set up a number of specialized testing companies consecutively. The IC testing system with the brand “Taisite” developed by these companies now occupies over 70% in domestic testing equipment market. More than 100 self-developed “BC3196 large-scale mixed-signal IC testing system” has equipped the IC production line of China Huarun Micro-electronics Corp., Ltd, which is the first localization example of IC testing system. In 2000, the first specialized IC Test Company, “Wu Xi Taisite Testing Corp., Ltd.” was established in China’s IC industry production base, Wu Xi, which made a breakthrough for the development of IC testing industry in this field. In 2004, “Beijing Huada Taisite Semiconductor Testing Technique Corp., Ltd.” was set up, jointly funded by China Huada IC Design Corporation, Ltd. and Beijing Institute of Automatic Test Technology, which is so far the biggest IC testing company in China.